Reliability and Availability of Quality Control Based on Wavelet Computer Vision
Nonfiction, Science & Nature, Mathematics, Statistics, Technology, Electronics
| Author: | Ivica Kuzmanić, Igor Vujović | ISBN: | 9783319133171 |
| Publisher: | Springer International Publishing | Publication: | November 18, 2014 |
| Imprint: | Springer | Language: | English |
| Author: | Ivica Kuzmanić, Igor Vujović |
| ISBN: | 9783319133171 |
| Publisher: | Springer International Publishing |
| Publication: | November 18, 2014 |
| Imprint: | Springer |
| Language: | English |
This short book presents a framework for assessing the reliability and availability of visual quality control systems, placing particular emphasis on wavelet-based analysis. It presents experimental results pertaining to the sensitivity of visual quality control to noise, as an example of dependencies. The influencing parameters are analyzed and included in the reliability model. These parameters are divided between the software and the hardware group, with one condition representing a combination of software and hardware, and another representing a combination of hardware and environmental conditions. In closing, the book suggests potential alternative approaches and examines system availability and reliability models, as well as calculations of their solutions.
This short book presents a framework for assessing the reliability and availability of visual quality control systems, placing particular emphasis on wavelet-based analysis. It presents experimental results pertaining to the sensitivity of visual quality control to noise, as an example of dependencies. The influencing parameters are analyzed and included in the reliability model. These parameters are divided between the software and the hardware group, with one condition representing a combination of software and hardware, and another representing a combination of hardware and environmental conditions. In closing, the book suggests potential alternative approaches and examines system availability and reliability models, as well as calculations of their solutions.
