A Unified Approach to the Finite Element Method and Error Analysis Procedures

Nonfiction, Science & Nature, Mathematics, Applied, Technology, Engineering, Mechanical
Cover of the book A Unified Approach to the Finite Element Method and Error Analysis Procedures by Julian A. T. Dow, Elsevier Science
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart
Author: Julian A. T. Dow ISBN: 9780080543420
Publisher: Elsevier Science Publication: November 9, 1998
Imprint: Academic Press Language: English
Author: Julian A. T. Dow
ISBN: 9780080543420
Publisher: Elsevier Science
Publication: November 9, 1998
Imprint: Academic Press
Language: English

A Unified Approach to the Finite Element Method and Error Analysis Procedures provides an in-depth background to better understanding of finite element results and techniques for improving accuracy of finite element methods. Thus, the reader is able to identify and eliminate errors contained in finite element models. Three different error analysis techniques are systematically developed from a common theoretical foundation: 1) modeling erros in individual elements; 2) discretization errors in the overall model; 3) point-wise errors in the final stress or strain results. Thoroughly class tested with undergraduate and graduate students.

A Unified Approach to the Finite Element Method and Error Analysis Procedures is sure to become an essential resource for students as well as practicing engineers and researchers.

  • New, simpler element formulation techniques, model-independent results, and error measures
  • New polynomial-based methods for identifying critical points
  • New procedures for evaluating sheer/strain accuracy
  • Accessible to undergraduates, insightful to researchers, and useful to practitioners
  • Taylor series (polynomial) based
  • Intuitive elemental and point-wise error measures
  • Essential background information provided in 12 appendices
View on Amazon View on AbeBooks View on Kobo View on B.Depository View on eBay View on Walmart

A Unified Approach to the Finite Element Method and Error Analysis Procedures provides an in-depth background to better understanding of finite element results and techniques for improving accuracy of finite element methods. Thus, the reader is able to identify and eliminate errors contained in finite element models. Three different error analysis techniques are systematically developed from a common theoretical foundation: 1) modeling erros in individual elements; 2) discretization errors in the overall model; 3) point-wise errors in the final stress or strain results. Thoroughly class tested with undergraduate and graduate students.

A Unified Approach to the Finite Element Method and Error Analysis Procedures is sure to become an essential resource for students as well as practicing engineers and researchers.

More books from Elsevier Science

Cover of the book Structural and Residual Stress Analysis by Nondestructive Methods by Julian A. T. Dow
Cover of the book Coal and Peat Fires: A Global Perspective by Julian A. T. Dow
Cover of the book Immunopharmacology by Julian A. T. Dow
Cover of the book Underwater Physiology by Julian A. T. Dow
Cover of the book Theoretical and Applied Aspects of Biomass Torrefaction by Julian A. T. Dow
Cover of the book Electrochemical Micromachining for Nanofabrication, MEMS and Nanotechnology by Julian A. T. Dow
Cover of the book Mathematical Concepts and Methods in Modern Biology by Julian A. T. Dow
Cover of the book Combustion, Flames and Explosions of Gases by Julian A. T. Dow
Cover of the book Ligand Efficiency Indices for Drug Discovery by Julian A. T. Dow
Cover of the book Advanced Chromatographic and Electromigration Methods in BioSciences by Julian A. T. Dow
Cover of the book Wheat Flour by Julian A. T. Dow
Cover of the book Handbook of Neuroendocrinology by Julian A. T. Dow
Cover of the book Brittle Matrix Composites 9 by Julian A. T. Dow
Cover of the book Building a Digital Forensic Laboratory by Julian A. T. Dow
Cover of the book Rapid Thermal Processing for Future Semiconductor Devices by Julian A. T. Dow
We use our own "cookies" and third party cookies to improve services and to see statistical information. By using this website, you agree to our Privacy Policy